#include "jtest.h"
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#include "ref.h"
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#include "arr_desc.h"
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#include "transform_templates.h"
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#include "transform_test_data.h"
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#include "type_abbrev.h"
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/*
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FFT fast function test template. Arguments are: function configuration suffix
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(q7/q15/q31/f32) and inverse-transform flag
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*/
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#define RFFT_FAST_DEFINE_TEST(config_suffix, ifft_flag) \
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JTEST_DEFINE_TEST(arm_rfft_fast_f32_##config_suffix##_test, \
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arm_fft_f32) \
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{ \
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arm_rfft_fast_instance_f32 rfft_inst_fut = {{0}, 0, 0}; \
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arm_rfft_fast_instance_f32 rfft_inst_ref = {{0}, 0, 0}; \
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\
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/* Go through all FFT lengths */ \
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TEMPLATE_DO_ARR_DESC( \
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fftlen_idx, uint16_t, fftlen, transform_rfft_fast_fftlens \
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, \
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\
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/* Initialize the RFFT and CFFT Instances */ \
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arm_rfft_fast_init_f32( \
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&rfft_inst_fut, fftlen); \
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\
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arm_rfft_fast_init_f32( \
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&rfft_inst_ref, fftlen); \
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\
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TRANSFORM_COPY_INPUTS( \
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transform_fft_f32_inputs, \
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fftlen * \
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sizeof(float32_t)); \
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\
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/* Display parameter values */ \
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JTEST_DUMP_STRF("Block Size: %d\n" \
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"Inverse-transform flag: %d\n", \
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(int)fftlen, \
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(int)ifft_flag); \
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\
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/* Display cycle count and run test */ \
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JTEST_COUNT_CYCLES( \
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arm_rfft_fast_f32( \
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&rfft_inst_fut, \
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(void *) transform_fft_input_fut, \
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(void *) transform_fft_output_fut, \
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ifft_flag)); \
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\
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ref_rfft_fast_f32( \
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&rfft_inst_ref, \
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(void *) transform_fft_input_ref, \
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(void *) transform_fft_output_ref, \
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ifft_flag); \
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\
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/* Test correctness */ \
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TRANSFORM_SNR_COMPARE_INTERFACE( \
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fftlen, \
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float32_t)); \
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\
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return JTEST_TEST_PASSED; \
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}
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RFFT_FAST_DEFINE_TEST(forward, 0U);
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RFFT_FAST_DEFINE_TEST(inverse, 1U);
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/*--------------------------------------------------------------------------------*/
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/* Collect all tests in a group */
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/*--------------------------------------------------------------------------------*/
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JTEST_DEFINE_GROUP(rfft_fast_tests)
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{
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JTEST_TEST_CALL(arm_rfft_fast_f32_forward_test);
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JTEST_TEST_CALL(arm_rfft_fast_f32_inverse_test);
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}
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