From aa38e5c1f48e31213ee349aa5cd6f06c85bda70d Mon Sep 17 00:00:00 2001
From: android <android@lingyun.com>
Date: Tue, 25 Jun 2024 21:49:39 +0800
Subject: [PATCH] Add GD32F103RCT6 ADC converter board SDK source code

---
 mcu_sdk/gd32f103/rk_eFire/Board/CMSIS/DSP/DSP_Lib_TestSuite/Common/src/basic_math_tests/scale_tests.c |   52 ++++++++++++++++++++++++++++++++++++++++++++++++++++
 1 files changed, 52 insertions(+), 0 deletions(-)

diff --git a/mcu_sdk/gd32f103/rk_eFire/Board/CMSIS/DSP/DSP_Lib_TestSuite/Common/src/basic_math_tests/scale_tests.c b/mcu_sdk/gd32f103/rk_eFire/Board/CMSIS/DSP/DSP_Lib_TestSuite/Common/src/basic_math_tests/scale_tests.c
new file mode 100644
index 0000000..2839a8f
--- /dev/null
+++ b/mcu_sdk/gd32f103/rk_eFire/Board/CMSIS/DSP/DSP_Lib_TestSuite/Common/src/basic_math_tests/scale_tests.c
@@ -0,0 +1,52 @@
+#include "jtest.h"
+#include "basic_math_test_data.h"
+#include "arr_desc.h"
+#include "arm_math.h"           /* FUTs */
+#include "ref.h"                /* Reference Functions */
+#include "test_templates.h"
+#include "basic_math_templates.h"
+#include "type_abbrev.h"
+
+
+#define JTEST_ARM_SCALE_TEST(suffix)                \
+    BASIC_MATH_DEFINE_TEST_TEMPLATE_BUF1_ELT2_BLK(  \
+        scale,                                      \
+        suffix,                                     \
+        TYPE_FROM_ABBREV(suffix),                   \
+        TYPE_FROM_ABBREV(suffix), /*elt1_type*/     \
+        int8_t, /*elt2_type*/                       \
+        TYPE_FROM_ABBREV(suffix))
+
+/* float32_t defined separately because it has less arguments */
+JTEST_DEFINE_TEST(arm_scale_f32_test,
+                  arm_scale_f32)
+{
+    TEST_TEMPLATE_BUF1_ELT1_BLK(
+        basic_math_f_all,
+        basic_math_eltsf,
+        basic_math_block_sizes,
+        float32_t,
+        float32_t,
+        float32_t,
+        arm_scale_f32,
+        ARM_scale_float_INPUT_INTERFACE,
+        ref_scale_f32,
+        REF_scale_float_INPUT_INTERFACE,
+        BASIC_MATH_COMPARE_INTERFACE);
+}
+
+JTEST_ARM_SCALE_TEST(q31);
+JTEST_ARM_SCALE_TEST(q15);
+JTEST_ARM_SCALE_TEST(q7);
+
+/*--------------------------------------------------------------------------------*/
+/* Collect all tests in a group. */
+/*--------------------------------------------------------------------------------*/
+
+JTEST_DEFINE_GROUP(scale_tests)
+{
+    JTEST_TEST_CALL(arm_scale_f32_test);
+    JTEST_TEST_CALL(arm_scale_q31_test);
+    JTEST_TEST_CALL(arm_scale_q15_test);
+    JTEST_TEST_CALL(arm_scale_q7_test);
+}

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