From aa38e5c1f48e31213ee349aa5cd6f06c85bda70d Mon Sep 17 00:00:00 2001
From: android <android@lingyun.com>
Date: Tue, 25 Jun 2024 21:49:39 +0800
Subject: [PATCH] Add GD32F103RCT6 ADC converter board SDK source code
---
mcu_sdk/gd32f103/rk_eFire/Board/CMSIS/DSP/DSP_Lib_TestSuite/Common/src/basic_math_tests/sub_tests.c | 33 +++++++++++++++++++++++++++++++++
1 files changed, 33 insertions(+), 0 deletions(-)
diff --git a/mcu_sdk/gd32f103/rk_eFire/Board/CMSIS/DSP/DSP_Lib_TestSuite/Common/src/basic_math_tests/sub_tests.c b/mcu_sdk/gd32f103/rk_eFire/Board/CMSIS/DSP/DSP_Lib_TestSuite/Common/src/basic_math_tests/sub_tests.c
new file mode 100644
index 0000000..a486842
--- /dev/null
+++ b/mcu_sdk/gd32f103/rk_eFire/Board/CMSIS/DSP/DSP_Lib_TestSuite/Common/src/basic_math_tests/sub_tests.c
@@ -0,0 +1,33 @@
+#include "jtest.h"
+#include "basic_math_test_data.h"
+#include "arr_desc.h"
+#include "arm_math.h" /* FUTs */
+#include "ref.h" /* Reference Functions */
+#include "test_templates.h"
+#include "basic_math_templates.h"
+#include "type_abbrev.h"
+
+#define JTEST_ARM_SUB_TEST(suffix) \
+ BASIC_MATH_DEFINE_TEST_TEMPLATE_BUF2_BLK( \
+ sub, \
+ suffix, \
+ TYPE_FROM_ABBREV(suffix), \
+ TYPE_FROM_ABBREV(suffix), \
+ BASIC_MATH_COMPARE_INTERFACE)
+
+JTEST_ARM_SUB_TEST(f32);
+JTEST_ARM_SUB_TEST(q31);
+JTEST_ARM_SUB_TEST(q15);
+JTEST_ARM_SUB_TEST(q7);
+
+/*--------------------------------------------------------------------------------*/
+/* Collect all tests in a group. */
+/*--------------------------------------------------------------------------------*/
+
+JTEST_DEFINE_GROUP(sub_tests)
+{
+ JTEST_TEST_CALL(arm_sub_f32_test);
+ JTEST_TEST_CALL(arm_sub_q31_test);
+ JTEST_TEST_CALL(arm_sub_q15_test);
+ JTEST_TEST_CALL(arm_sub_q7_test);
+}
--
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