From aa38e5c1f48e31213ee349aa5cd6f06c85bda70d Mon Sep 17 00:00:00 2001
From: android <android@lingyun.com>
Date: Tue, 25 Jun 2024 21:49:39 +0800
Subject: [PATCH] Add GD32F103RCT6 ADC converter board SDK source code
---
mcu_sdk/gd32f103/rk_eFire/Board/CMSIS/DSP/DSP_Lib_TestSuite/Common/src/matrix_tests/matrix_test_group.c | 19 +++++++++++++++++++
1 files changed, 19 insertions(+), 0 deletions(-)
diff --git a/mcu_sdk/gd32f103/rk_eFire/Board/CMSIS/DSP/DSP_Lib_TestSuite/Common/src/matrix_tests/matrix_test_group.c b/mcu_sdk/gd32f103/rk_eFire/Board/CMSIS/DSP/DSP_Lib_TestSuite/Common/src/matrix_tests/matrix_test_group.c
new file mode 100644
index 0000000..c87439d
--- /dev/null
+++ b/mcu_sdk/gd32f103/rk_eFire/Board/CMSIS/DSP/DSP_Lib_TestSuite/Common/src/matrix_tests/matrix_test_group.c
@@ -0,0 +1,19 @@
+#include "jtest.h"
+#include "matrix_tests.h"
+
+JTEST_DEFINE_GROUP(matrix_tests)
+{
+ /*
+ To skip a test, comment it out.
+ */
+ JTEST_GROUP_CALL(mat_add_tests);
+ JTEST_GROUP_CALL(mat_cmplx_mult_tests);
+ JTEST_GROUP_CALL(mat_init_tests);
+ JTEST_GROUP_CALL(mat_inverse_tests);
+ JTEST_GROUP_CALL(mat_mult_tests);
+ JTEST_GROUP_CALL(mat_mult_fast_tests);
+ JTEST_GROUP_CALL(mat_sub_tests);
+ JTEST_GROUP_CALL(mat_trans_tests);
+ JTEST_GROUP_CALL(mat_scale_tests);
+ return;
+}
--
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