From aa38e5c1f48e31213ee349aa5cd6f06c85bda70d Mon Sep 17 00:00:00 2001
From: android <android@lingyun.com>
Date: Tue, 25 Jun 2024 21:49:39 +0800
Subject: [PATCH] Add GD32F103RCT6 ADC converter board SDK source code
---
mcu_sdk/gd32f103/rk_eFire/Board/CMSIS/DSP/DSP_Lib_TestSuite/Common/src/statistics_tests/std_tests.c | 34 ++++++++++++++++++++++++++++++++++
1 files changed, 34 insertions(+), 0 deletions(-)
diff --git a/mcu_sdk/gd32f103/rk_eFire/Board/CMSIS/DSP/DSP_Lib_TestSuite/Common/src/statistics_tests/std_tests.c b/mcu_sdk/gd32f103/rk_eFire/Board/CMSIS/DSP/DSP_Lib_TestSuite/Common/src/statistics_tests/std_tests.c
new file mode 100644
index 0000000..b80ed71
--- /dev/null
+++ b/mcu_sdk/gd32f103/rk_eFire/Board/CMSIS/DSP/DSP_Lib_TestSuite/Common/src/statistics_tests/std_tests.c
@@ -0,0 +1,34 @@
+#include "jtest.h"
+#include "statistics_test_data.h"
+#include "arr_desc.h"
+#include "arm_math.h" /* FUTs */
+#include "ref.h" /* Reference Functions */
+#include "test_templates.h"
+#include "statistics_templates.h"
+#include "type_abbrev.h"
+
+#define JTEST_ARM_STD_TEST(suffix) \
+ STATISTICS_DEFINE_TEST_TEMPLATE_BUF1_BLK( \
+ std, \
+ suffix, \
+ TYPE_FROM_ABBREV(suffix), \
+ TYPE_FROM_ABBREV(suffix), \
+ STATISTICS_SNR_COMPARE_INTERFACE)
+
+JTEST_ARM_STD_TEST(f32);
+JTEST_ARM_STD_TEST(q31);
+JTEST_ARM_STD_TEST(q15);
+
+/*--------------------------------------------------------------------------------*/
+/* Collect all tests in a group. */
+/*--------------------------------------------------------------------------------*/
+
+JTEST_DEFINE_GROUP(std_tests)
+{
+ /*
+ To skip a test, comment it out.
+ */
+ JTEST_TEST_CALL(arm_std_f32_test);
+ JTEST_TEST_CALL(arm_std_q31_test);
+ JTEST_TEST_CALL(arm_std_q15_test);
+}
--
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